Industrial Anomaly Detection

Deep learning and spectral clustering for fabric defect detection and localization

This project focused on abnormal image detection and defect localization for fabric products. The goal was to develop automated quality-control methods that can separate defective and non-defective images and localize abnormal regions using machine learning and deep learning.

Role: Project Lead

Key contributions:

  • Applied spectral clustering to separate images into defect and non-defect groups for binary classification.
  • Used transfer learning with deep convolutional neural networks for defect detection and localization.
  • Developed computer vision workflows for automated industrial quality inspection.
  • Contributed to anomaly detection research for real-time industrial applications.

Research focus:

  • Image anomaly detection
  • Defect localization
  • Spectral clustering
  • Transfer learning
  • Industrial computer vision